Electrical characterization of GaTe and GaTe:Cu semiconductor compounds

Güder H., Abay B., Efeoǧlu H., Coşkun C., Aydoǧan S., Yoǧurţ Y.

Turkish Journal of Physics, vol.25, no.6, pp.523-527, 2001 (Scopus, TRDizin) identifier

  • Publication Type: Article / Article
  • Volume: 25 Issue: 6
  • Publication Date: 2001
  • Journal Name: Turkish Journal of Physics
  • Journal Indexes: Scopus, TR DİZİN (ULAKBİM)
  • Page Numbers: pp.523-527
  • Keywords: Electrical characterization, GaTe, Layered semiconductors
  • Hatay Mustafa Kemal University Affiliated: Yes

Abstract

Electrical properties of GaTe and GaTe:Cu binary compound semiconductors were investigated by Hall effect and resistivity measurements in the 77-320 K temperature range. Donor and acceptor densities, compensation ratios, acceptor ionization energies, valence band effective mass of holes and effective density of states in valence band were determined for the undoped and Cu doped samples using the single donor-single acceptor analysis of the hole concentration. Temperature coefficient of the hole mobility was determined and compared with related theories.