Variation of the key structural, morphological, and optical properties of nanostructured copper(II) oxide (CuO) thin films using surfactant CAPB as a capping agent

Yıldırım G., YÜCEL E.

Journal of Materials Science: Materials in Electronics, vol.33, no.24, pp.19057-19070, 2022 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 33 Issue: 24
  • Publication Date: 2022
  • Doi Number: 10.1007/s10854-022-08743-3
  • Journal Name: Journal of Materials Science: Materials in Electronics
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, MEDLINE, Metadex, Civil Engineering Abstracts
  • Page Numbers: pp.19057-19070
  • Hatay Mustafa Kemal University Affiliated: Yes

Abstract

In this study, copper(II) oxide thin-film samples were fabricated by the SILAR technique in the absence and presence of surfactant as a capping agent. The obtained CuO structures were characterized based on XRD, FTIR, SEM, EDS, SPM, and UV–vis spectroscopy. The experimental data show that the presence of CAPB surfactants affects the structural and optical properties of the films. When the surface characteristics of the films were evaluated by SPM analysis, it was concluded that the addition of surfactant to the bath increased the surface roughness of the films. The band gaps of the samples increased from 1.50 to 1.78 eV as a result of the increased amount of surfactant CAPB. Also, it was observed that the optical transmittance value increased more than four times when 4% CAPB was added to the bath of the films.