Calculation of K-shell fluorescence yields for low-Z elements


Nekkab M., Kahoul A., Deghfel B., Aylikci N. K., Aylikçi V.

4th International Congress in Advances in Applied Physics and Materials Science, APMAS 2014, Fethiye, Türkiye, 24 - 27 Nisan 2014, cilt.1653, (Tam Metin Bildiri) identifier identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 1653
  • Doi Numarası: 10.1063/1.4914268
  • Basıldığı Şehir: Fethiye
  • Basıldığı Ülke: Türkiye
  • Anahtar Kelimeler: Inner-shell ionization process, K-shell fluorescence yields
  • Hatay Mustafa Kemal Üniversitesi Adresli: Evet

Özet

The analytical methods based on X-ray fluorescence are advantageous for practical applications in a variety of fields including atomic physics, X-ray fluorescence surface chemical analysis and medical research and so the accurate fluorescence yields (ω K ) are required for these applications. In this contribution we report a new parameters for calculation of K-shell fluorescence yields (ω K ) of elements in the range of 11≤Z≤30. The experimental data are interpolated by using the famous analytical function (ωk/(1-ωk))1/q (were q=3, 3.5 and 4) vs Z to deduce the empirical K-shell fluorescence yields. A comparison is made between the results of the procedures followed here and those theoretical and other semi-empirical fluorescence yield values. Reasonable agreement was typically obtained between our result and other works.