Electronic Structure Study of Ni-B Alloy Coatings by XAFS Technique
Journal of Electronic Materials, vol.50, no.12, pp.7000-7004, 2021 (SCI-Expanded, Scopus)
- Publication Type: Article / Article
- Volume: 50 Issue: 12
- Publication Date: 2021
- Doi Number: 10.1007/s11664-021-09203-0
- Journal Name: Journal of Electronic Materials
- Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, PASCAL, Applied Science & Technology Source, Chemical Abstracts Core, Chimica, Compendex, Computer & Applied Sciences, INSPEC
- Page Numbers: pp.7000-7004
- Keywords: electronic structure, Ni-B alloy, XAFS, XRD
- Hatay Mustafa Kemal University Affiliated: Yes
Abstract
The crystal and electronic structure properties of Ni-B (nickel-boron) alloy coatings produced by an electrodeposition method have been investigated. The crystal structures of the alloy coatings were determined by x-ray diffraction patterns and supported by extended x-ray absorption fine structure (EXAFS) spectroscopy. The local atomic structure around the Ni atom was obtained from EXAFS studies at the Ni K-edge, and the EXAFS data were fitted with theoretical calculations. With the addition of boron atoms in the nickel environment, NiB composite alloys were formed in the crystals with an orthorhombic "Cmcm" structure. The analysis revealed a limited effect of boron doping in the electronic structure of the nickel atoms. Boron atoms were determined as sitting between the Ni atoms and causing a disturbance in the crystal structure due to providing inhomogeneous interstitial potential and defects.