Electrochromism of W–In oxide thin films: Implications for cycling durability

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SORAR İ., Pehlivan İ. B., Granqvist C. G., Niklasson G. A.

Thin Solid Films, vol.697, 2020 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 697
  • Publication Date: 2020
  • Doi Number: 10.1016/j.tsf.2020.137830
  • Journal Name: Thin Solid Films
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Academic Search Premier, PASCAL, Aerospace Database, Applied Science & Technology Source, Chimica, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, Metadex, Civil Engineering Abstracts
  • Keywords: Cycling durability, Electrochromism, Sputter deposition, Thin films, Tungsten oxide, Indium oxide
  • Hatay Mustafa Kemal University Affiliated: Yes

Abstract

Electrochromic W oxide and W–In oxide thin films were prepared by dual-target reactive DC magnetron sputtering and were cycled voltammetrically in an electrolyte of lithium perchlorate in propylene carbonate. Film degradation was investigated for up to 500 cycles in the voltage ranges 1.5–4.0, 1.7–4.0 and 2.0–4.0 V vs. Li/Li+, and optical transmittance was recorded concurrently. Indium doping was found to be unambiguously detrimental to electrochromic cycling durability, which resolves an outstanding issue related to recently discovered unprecedented durability of potentiostatically pretreated W oxide films backed by In2O3:Sn and gives strong support in favor of beneficial effects of solid-electrolyte interfacial layers.