Photoelectron, Compton and characteristic x-ray escape from an HPGe Detector in the range 8-52 keV
X-Ray Spectrometry, cilt.33, sa.6, ss.439-446, 2004 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Özet
- Cilt numarası: 33 Sayı: 6
- Basım Tarihi: 2004
- Doi Numarası: 10.1002/xrs.746
- Dergi Adı: X-Ray Spectrometry
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.439-446
- Hatay Mustafa Kemal Üniversitesi Adresli: Hayır
Özet
Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright © 2004 John Wiley & Sons, Ltd.