Photoelectron, Compton and characteristic x-ray escape from an HPGe Detector in the range 8-52 keV

Yilmaz E., CAN C.

X-Ray Spectrometry, vol.33, no.6, pp.439-446, 2004 (SCI-Expanded) identifier

  • Publication Type: Article / Abstract
  • Volume: 33 Issue: 6
  • Publication Date: 2004
  • Doi Number: 10.1002/xrs.746
  • Journal Name: X-Ray Spectrometry
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.439-446
  • Hatay Mustafa Kemal University Affiliated: No

Abstract

Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba, and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright © 2004 John Wiley & Sons, Ltd.