Ozden, E. Et Al. 2017. Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots. Seed Science and Technology , vol.45, no.1 , 243-247.

Ozden, E., MAVİ, K., SARI, E., & DEMİR, İ., (2017). Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots. Seed Science and Technology , vol.45, no.1, 243-247.

Ozden, E. Et Al. "Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots," Seed Science and Technology , vol.45, no.1, 243-247, 2017

Ozden, E. Et Al. "Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots." Seed Science and Technology , vol.45, no.1, pp.243-247, 2017

Ozden, E. Et Al. (2017) . "Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots." Seed Science and Technology , vol.45, no.1, pp.243-247.

@article{article, author={E. Ozden Et Al. }, title={Radicle emergence test predicts longevity (half viability period, p50) of leek seed lots}, journal={Seed Science and Technology}, year=2017, pages={243-247} }